Items where Author is "Hai, H. Lo"

[up] Up a level
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 1.

Article

B. I. Reaz, Mamun and F. Lee, Weng and Hamid, Nor Hisham and Hai, H. Lo and Y. M. Shakaff, Ali (2009) High Degree of Testability Using Full Scan Chain and ATPG: An Industrial Perspective. Journal of Applied Sciences. ISSN 18125654

This list was generated on Tue Nov 26 22:49:38 2024 +08.