Items where Author is "Hai, H. Lo"

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B. I. Reaz, Mamun and F. Lee, Weng and Hamid, Nor Hisham and Hai, H. Lo and Y. M. Shakaff, Ali (2009) High Degree of Testability Using Full Scan Chain and ATPG: An Industrial Perspective. Journal of Applied Sciences. ISSN 18125654

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