Items where Author is "Zwolinski, Mark"

Article

Mohammadat, Mohamed Tag Elsir and Zain Ali , Noohul Basheer and Hussin, Fawnizu Azmadi and Zwolinski, Mark (2015) Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 23 (3). pp. 580-583. ISSN 1063-8210

Mohammadat, Mohamed Tag Elsir and Zain Ali , Noohul Basheer and Hussin, Fawnizu Azmadi and Zwolinski, Mark (2014) Multivoltage Aware Resistive Open Fault Model. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 22 (2). pp. 220-231. ISSN 1063-8210

Conference or Workshop Item

Shukla , Vineeta and Zain Ali, Noohul Basheer and Hussin, Fawnizu Azmadi and Zwolinski, Mark (2013) On testing of MEDA based digital microfluidics biochips. In: 2013 5th Asia Symposium Quality Electronic Design (ASQED), 26-28 Aug. 2013, Penang, Malaysia.

Zain Ali, Noohul Basheer and Zwolinski, Mark and Al-Hashimi, Bashir M (2007) Testing of Level Shifters in Multiple Voltage Designs. In: Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on , 11-14 Dec 2007, Marrakech, Morocco.

Zain Ali, Noohul Basheer and Zwolinski, Mark and Al-Hashimi, Bashir M and Harrod, Peter (2006) Dynamic Voltage Scaling Aware Delay Fault Testing. In: Eleventh IEEE European Test Symposium, 21-24 May, 2006, Southampton, UK.